Master thesis "Creation of an LEIS reference data collection"
IONTOF is a manufacturer of innovative surface analysis instruments with various product lines for Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and Low Energy Ion Scattering (LEIS).
Founded as a classic spin-off of the University of Münster, IONTOF is today the technological pioneer in the field of ToF-SIMS and LEIS devices. To strengthen our leading position, we would like to give students the opportunity to gain insight into these fields and write a master's thesis.
Description of the activity
Improve the quantification of LEIS spectra and build a collection of reference data:
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Learning the basics and application of LEIS as well as operation of the device, incl. software for device control and data evaluation
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Development and implementation of a measurement plan, including sample selection, preparation, in-situ pretreatment to eliminate atmospheric contamination and analysis under different measurement conditions.
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Data analysis, visualization and structured data storage of measurement results
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Validation of results by using multiple samples and, if necessary, various LEIS devices
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Ideally, preparation of a manuscript for a data-oriented scientific journal (peer-reviewed)
Expected qualification
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Advanced study of materials science, Analytic chemistry, surface sciences or scientific instrumentation
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Ability to learn quickly and in a structured way, to work with attention to detail, both in the laboratory and in documentation
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Interest in the described task and the improvement of an innovative surface analysis method
Our offer
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Intensive training of all aspects of LEIS (ideally as an internship/project work before starting the Master's thesis)
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Insights into a global company in a scientific/high-tech environment
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Responsibility for the project and space for your own ideas
We are looking for a SIMS postdoc for the EU cofounded project "process diagnostics". As part of the project, you will construct electrochemical cells (e.g. Na batteries or electrolysers) and characterise them in detail electrochemically and post mortem using surface analytical methods (ToF-SIMS, XPS, SEM).
The experiments are then repeated operando in a secondary ion mass spectrometer (SIMS). Special setups have to be designed for this challenging task. The coupled operando diagnostics will be used to obtain specific information on the material degradation of the electrochemical processes taking place.
Position Type
Full time position
Employment Period
1/4/2025 - 30/6/2027
Our Insitute
At institute of physical chemistry at Justus-Liebig University Giessen (JLU) we offer an inspiring atmosphere with more than 70 co-workers in the field of energy related materials research.
Our labs are well equipped. Concerning SIMS we are running one IONTOF M6 Plus (includes SPM module) as well as one M6 Hybrid SIMS (with additional orbitrap mass analyser). The official job announcement will be published in the JLU job market in the beginning of 2025.
Contact
If you are interested in this position, please contact in advance Prof. Marcus Rohnke
The NSG Group is a global leader in glass manufacturing in three business areas: Architectural, Automotive and Creative Technology.
Our mission is to change our surroundings and improve our world. We work towards our Vision which is based on the strong belief in our long-held values: sincere and ethical culture, commitment to safety and technology and respect for people.
The role
The role is within the Surface Analysis and Spectroscopy team, part of the Engineering and Analysis Group within the global NSG R&D function. The team provides expert analytical support to the Global NSG Group and Licensee operations, delivering critical technical support to manufacturing lines and supporting the development of new processes and products. The team also progresses capability research projects to increase our groups analytical expertise.
We are currently looking to recruit a technical specialist to work in our ToF SIMS area; the role would involve working collaboratively with other team members in problem solving investigations and will also extend to the use of other surface analysis techniques. The successful candidate would progress to provide expert SIMS analysis and develop new analytical techniques and approaches for NSG applications. The successful candidate should have previous analytical experience either from an academic or industrial background. A knowledge of surface analytical techniques would be an advantage, but full SIMS training will be provided.
Key responsibilities will include
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Operation of highly sophisticated analytical equipment, the analysis of glass, thin films and associated materials.
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Interpretation of results generated, preparation of formal reports and the use of other forms of communication to explain results.
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Contribution to multidisciplinary project teams and troubleshooting activities.
What we are looking for - You and your skills
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A degree qualified chemist, physicist, or materials scientist.
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Direct analytical experience and technical reporting, ideally using surface analysis techniques.
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Be able to expand capability using data analysis tools and techniques.
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Be innovative and self-motivated.
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Able to work as part of a small team with a desire to build technical knowledge.
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Good analytical skills and attention to detail.
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Influential skills, able to communicate ideas clearly.
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Interested in understanding internal and external customer circumstances, problems, expectations, and needs.
Benefits
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Defined contribution pension scheme with Aviva.
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Management Incentive Plan up to 10% of salary (not guaranteed).
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Holiday Salary Exchange Scheme.
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25 days holiday plus declared public holidays.
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On site car parking.
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On site restaurant.
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On site fitness activities and events.
We give everyone an equal opportunity to contribute to their full potential and harness the richness of ideas.
If you believe you can take on the challenge, we very much want to hear from you. Application is by CV and covering letter to
quoting job code PTML P24-18.
The closing date is 5pm on Friday 15th November 2024.
Third Party Job CEA
Materials and device characterization by SIMS
Category
Micro and nano technologies
Contract
Fixed-term contract
Socio-professional category
Executive
Site / Location
Grenoble
Job location
France, Auvergne-Rhône-Alpes, Isère (38)
Organisation
The French Alternative Energies and Atomic Energy Commission (CEA) is a key player in research, development and innovation in four main areas:
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defence and security
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nuclear energy (fission and fusion)
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technological research for industry
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fundamental research in the physical sciences and life sciences
Drawing on its widely acknowledged expertise, and thanks to its 16000 technicians, engineers, researchers and staff, the CEA actively participates in collaborative projects with a large number of academic and industrial partners.
The CEA is established in ten centers spread throughout France.
Applicant Profile
Master’s Degree (Bac+5) in physics, materials science or microelectronics and if possible a PhD. Ideally you will have an initial experience in R&D (academic or industrial) in microelectronics or materials analysis. A good practical knowledge of (TOF)-SIMS techniques is required. You should be at ease speaking, writing and listening to English. IT/Programming skills and knowledge of Python would be appreciated.
The ability to work in a team, to be rigorous, methodic, conscientious are required for this job. A sense of service, a taste for innovation, autonomy, pedagogy, communication skills and the reflex to patent are also important.
Languages
English (Fluent)
Job Description
You will join the team of SIMS analysts in the surface and interface analysis laboratory at the CEA-Leti in Grenoble. You will be responsible for SIMS analysis on materials and devices from the technology development teams at the CEA-Leti.
The following missions:
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Interface with device and process engineers to understand the analytical question and define the appropriate techniques and protocols in order to perform the analysis within the requested time.
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Perform measurements on the four recent (TOF)-SIMS instruments. Treat and interpret the acquired data, mainly using commercial software, but eventually using Python if required. Produce analysis reports that may be presented orally at technical review meetings.
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Develop the advanced, innovative protocols to meet the needs of current and future projects of the CEA-Leti. With this aim, you will be an integral part of characterization projects at the national, European and international levels. You may also participate in the definition of internships and PhD subjects as well as supervision.
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Participate in the evolution of the sample reference library in ad equation with the development of new analysis protocols.
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Contribute to the day to day running of the instruments : monitoring of instrument performance, and first-level maintenance in liaison with the maintenance team or vendor.
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Anticipate future needs and improvements to instruments as part of the yearly technical roadmap exercise. This will require staying up-to-date on literature in the field as well as maintaining a professional network in the domain.
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Communicate results both internally and externally via national and international conferences, scientific and technical networks, journal articles and patents.
This job opening will require the ability to analyze a wide range of samples from the different technologies developed at the CEA-Leti and necessitate interactions with the teams involved. To fulfill these missions you will need to be independent, highly motivated, curious, and able to take initiatives, with good interpersonal skills. The working environment is fast-paced, multicultural and ambitious, with permanent interactions with young researchers (interns, PhDs students and post-docs), senior experts and international partners of the CEA-Leti.
For more information and the full job description follow this link.
IONTOF is neither responsible nor liable for any details or contents of the third party opportunites.
All corresponding communication has to be made directly with the respective employing institution.
