at the IONTOF Career Forum
IONTOF headquarter, Münster, Germany
Current job openings
Technical Project Manager/ Engineer (m/w/d)
IONTOF is a medium-sized manufacturer of innovative surface analysis instruments with various product lines for Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS). In order to further strengthen our leading position in this market, highly professional and successful customer support is an important aspect of our strategy. We are currently looking to fill the position of, Technical Project Manager/ Engineer (m/w/d) (full time).

Your tasks
Independent project management including the final assembly and testing of instruments in our premises as well as the on-site installation at international customers' sites, making sure that the instrument meets all specifications
Internal and external training courses for employees and international customers as well as further development of analysis methods
Development of test procedures for complete machines and individual components
Documentation, transfer of know-how and problem solving in collaboration with other departments
Direct communication with our R & D department regarding the further development of all products
Your qualification
A degree in a technical or scientific subject of study (physics, chemistry or similar)
Interest in electronics, ultra-high vacuum techniques and surface analysis
An excellent knowledge of the English language, other languages are advantageous
Ability to understand and communicate complex issues
Willingness to travel
Technical skills
Intercultural competence and openness
A Ph.D. is desirable

Our offer
Exciting tasks in an international environment
A future-proof career with a good salary, yearly salary rises and bonus payments
Flexible working hours and remote working possibilities
Company pension plan and contributions to capital forming payments
Company health insurance
Company events
Sponsored "job bike" or "job ticket"
Are you in the mood for a new challenge? Please send us your application and let us know your salary expectations as well as your earliest starting date.

Claudia Schirdewan
Heisenbergstraße 15
48149 Münster

Master thesis "Creation of an LEIS reference data collection"
IONTOF is a manufacturer of innovative surface analysis instruments with various product lines for Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and Low Energy Ion Scattering (LEIS).
Founded as a classic spin-off of the University of Münster, IONTOF is today the technological pioneer in the field of ToF-SIMS and LEIS devices. To strengthen our leading position, we would like to give students the opportunity to gain insight into these fields and write a master's thesis.

Description of the activity
Improve the quantification of LEIS spectra and build a collection of reference data:

Learning the basics and application of LEIS as well as operation of the device, incl. software for device control and data evaluation
Development and implementation of a measurement plan, including sample selection, preparation, in-situ pretreatment to eliminate atmospheric contamination and analysis under different measurement conditions.
Data analysis, visualization and structured data storage of measurement results
Validation of results by using multiple samples and, if necessary, various LEIS devices
Ideally, preparation of a manuscript for a data-oriented scientific journal (peer-reviewed)
Expected qualification
Advanced study of materials science, Analytic chemistry, surface sciences or scientific instrumentation
Ability to learn quickly and in a structured way, to work with attention to detail, both in the laboratory and in documentation
Interest in the described task and the improvement of an innovative surface analysis method

Our offer
Intensive training of all aspects of LEIS (ideally as an internship/project work before starting the Master's thesis)
Insights into a global company in a scientific/high-tech environment
Responsibility for the project and space for your own ideas
Applications via email to:

Any questions please contact:

Dr. Thomas Grehl

Third Party Job
ToF-SIMS Metrology Engineer
Engineering - Leuven

As Metrology Engineer, you will perform daily ToF-SIMS analyses and will develop new approaches to address metrology challenges.

What you will do
The composition analysis team provides imec-wide support in materials characterization by means of secondary ion mass spectrometry (SIMS) using both Time-of-Flight (ToF-SIMS) and Magnetic Sector (MS-SIMS) instruments. As ToF-SIMS Metrology engineer, you will perform daily ToF-SIMS measurements to support the fab demand, the different R&D activities within imec and the PhD student works. You will also be working closely with the researchers of the SIMS team in developing for example new internal SIMS references, optimizing ToF-SIMS analysis conditions for specific requests, optimizing the ToF-SIMS instrument, ....

You perform daily ToF-SIMS analyses.
You contribute and oversee the execution, interpretation, and reporting of ToF-SIMS analyses, and you advise internal and external customers.
You investigate and develop new methods / approaches to address metrology challenges (e.g. low-dimensional nanostructures).
You document best practices and provide training to the team members.
You contribute to deliverables of funded research projects and programs.
You contribute to internal conferences/workshops.

The work will consist of experimental work, data analysis and interpretation, interaction with imec engineers/researchers, and of literature studies. As part of the Materials and Component Analysis (MCA) department, it is expected that you gain knowledge in other characterization methods in the MCA department and in the fab, and that you correlate your results to other characterization methods and to the advanced process and device technology.

What we do for you
We offer you the opportunity to join one of the world’s premier research centers in nanotechnology at its headquarters in Leuven, Belgium. With your talent, passion and expertise, you’ll become part of a team that makes the impossible possible. Together, we shape the technology that will define the society of tomorrow.

We are?committed to being an inclusive employer?( and proud of our open, multicultural, and informal working environment with ample possibilities to take initiative and show responsibility. In everything we do, your future colleagues are guided by the imec values of passion, excellence, connectedness, and integrity. We commit to supporting and guiding you in this process, not only with words but also with tangible actions. Through, 'our corporate university', we actively invest in your development to further your technical and personal growth.

We are aware that your valuable contribution makes imec a top player in its field. Your energy and commitment are therefore appreciated by means of a market appropriate salary with many fringe benefits.

Who you are
You have a Master of Science / Master in Engineering or a PhD in Physics or Chemistry.
You have experience in ToF-SIMS (and Scanning Probe Microscopy) in an academic or industrial R&D lab environment.
You have strong analytical skills and intellectually creativity.
You show excellent communication and reporting skills as you will be required to interface with internal customers.
Experienced in materials characterization, both experimental and theoretical, is highly valued.
Since you will be working in a highly international environment and will be maintaining a good contact with colleagues and co-workers from all over the world, fluency in English is essential.

For more information and the full job description follow this link.

Link:  Job description imec
Third Party Job
The Weizmann Insitute
Research assistant
Job description
Setup, operation and maintenance of imaging mass spectrometers
Sample preparation for mass spectrometry imaging, eg cryo-sectioning
Analytical method development & MSI data analysis of MALDI and SIMS imaging data
Independent project management: from kick-off meeting, identification of the scientists' needs, performing analysis, data treatment and data presentation to the customers/scientists in close collaboration with the head of the unit
Reporting results and assisting scientists in preparing data for publication

Required education and skills
PhD degree in Analytical Chemistry/Chemistry or Physics in an academic institute or university
Experience in a mass spectrometry or mass spectrometry imaging an advantage
LC/MS & metabolomics of biological samples experience an advantage
Consistent record of analytical and problem-solving skills as required in an academic research institute
Strong communication skills in English, verbally and in writing and the ability to efficiently coordinate projects with customers/principle investigators in the institute

Department of Life Sciences Research

Job field
lab worker

Job number

For more information and the full job description follow this link.

Link:  Job description The Weizmann Insitute
Third Party Job
ToF-SIMS and OrbitrapTM-SIMS analyses to unravel the chemistry of thin EUV photoresist layers

Help define the future of lithography.

Photolithography is a well-established process used for patterning in microelectronic device fabrication. In Extreme Ultra-Violet (EUV) lithography – the most recent lithography technology using photons of 13.5 nm wavelength - research is ongoing regarding the fundamental resist (PR) chemistry active in the different components of chemically amplified resists (CARs), metal oxide resists (MORs), scissioning type resists, molecular resists. In the case of the well-known CAR system, multiple components are involved in its formulation (i.e. polymer, Photo Acid Generator (PAG) and quencher) at various steps of the process. Indeed, many aspects are still not fully understood, with examples including, but not limited to, the distribution of each constituent within the photoresist layer, the specific products generated by the chemical reactions involved, and the proportion of components able to efficiently carry out the reactions (i.e. acid formation, deprotection, etc.). Further research is addressed to the understanding of the underlayer underneath the resist and their relationship/interdependency.

Secondary Ion Mass Spectrometry (SIMS) is a key surface analysis technique in which 1D (depth profiles), 2D (spatial imaging) and 3D (volumetric imaging) distributions of elements and molecules with a solid substrate can be derived. SIMS operates by directing an energetic ion beam, termed the primary ion beam, at the surface of interest. This induces the emission of surface atoms and molecules, with a small fraction departing in an ionized state. The departing ions, henceforth referred to as secondary ions, are extracted and passed through a mass analyzer such that all elements (H-U), isotopes thereof, as well as molecules can be identified.

When examining organic films, molecular integrity can be retained through the use of a Gas Cluster Ion Beam (GCIB) as this allows for the impact energy per atom (within the impacting molecule) to be reduced to inter-molecular bond energies. And since inter-molecular bond energies are less than intra-molecular bond energies, GCIBs provide a means to non-destructively examine organic molecules and their distributions in 1D, 2D and 3D.

Time of Flight (ToF)-SIMS is one of the most heavily used techniques to study the distribution of organics. This is due to its capability of detecting characteristic molecular peaks of the studied system with a high mass resolving power of ~104, with a lateral resolution of <100 nm, with a depth resolution of <5 nm and all to high sensitivity. However, when studying organic systems such the photoresist layers described, much higher mass resolving power might be needed to avoid any mass interference that would result in incorrect data interpretation. OrbitrapTM mass analyzers are a recent addition to the SIMS arsenal that allows for even greater mass resolving power (~20× that possible in ToF-SIMS) and the possibility for carrying out Tandem Mass Spectrometry (MS) (also called MS/MS) secondary ion peak verification. The MS/MS capability has been highly successful in the analysis of complex organic materials in mass spectrometry. This allows for greater confidence in peak assignments, especially when examining large organic molecular secondary ions.


The OrbitrapTM-SIMS analytical methodology has been already successfully applied to a variety of biological systems, especially thanks to the label-free imaging approach and the MS/MS capability, as first reported by Passarelli et al.. A first demonstration of the need for such an approach in the analysis of photoresist layers has been recently provided by Spampinato et al..

This project aims to the further application of ToF-SIMS and OrbitrapTM-SIMS methodologies (including the use of GCIB and MS/MS capabilities) to unlocking the chemistry involved during the EUV photo exposure on thin photoresist layers when the composition and the processing conditions vary. This study will also give the opportunity to find a clear logic between formulation and performances of such layers.

This work will be done in a collaboration between imec, Belgium (PR group and Materials and Components Analysis department) and National Physical Laboratory (NPL), UK, offering expertise in a multitude of characterization techniques in support of this project. The very close collaboration with the process engineers of imec and its partners warrants direct industrial impact.

For more information and the full job description follow this link. Link:  Job description imec

IONTOF is neither responsible nor liable for any details or contents of the third party opportunites.
All corresponding communication has to be made directly with the respective employing institution.