Full-Stack-Entwickler für globale Workflows (m/w/d)
Die IONTOF GmbH ist ein mittelständisches Unternehmen und stellt an ihrem Hauptsitz im Wissenschaftspark Münster innovative High-Tech-Geräte zur Oberflächenanalytik für namhafte Kunden in Industrie und Forschung her. Um unsere Führungsposition in diesem Zukunftsmarkt weiter auszubauen, suchen wir zum nächstmöglichen Zeitpunkt zur Verstärkung unseres engagierten Teams in Vollzeit einen Full-Stack-Entwickler für globale Workflows (m/w/d).
Ihre Aufgaben
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Entwurf, Entwicklung, Test und Deployment von innovativen Cloud-Lösungen für Workflows mit den IONTOF Niederlassungen und anderen internationalen Organisationen
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Weiterentwicklung, Test, Dokumentation und Refactoring des Front- und Backends des bestehenden Workflow-Systems einschließlich damit verbundener Software-Komponenten und Anwendungen
Ihr Qualifikation
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Abgeschlossenes technisches oder naturwissenschaftliches Studium
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Hervorragende Kenntnisse in Python und JavaScript
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Umfassende Erfahrungen mit SQL, HTML5, CSS und JavaScript, Datenbankadministration und Code-Versionierung
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Teamfähigkeit und der ausgeprägte Wille, gemeinsam Lösungen höchster Qualität zu erarbeiten
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Kenntnisse in agilen Entwicklungsmethoden, Docker und Debian-Linux
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Sehr gute Englischkenntnisse
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Erfahrung im Umgang mit weiteren Web-Technologien ist von Vorteil
Unser Angebot
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Förderung und Unterstützung bei der beruflichen wie persönlichen Weiterentwicklung
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Eine Karriere in einem zukunftssicheren Unternehmen mit einer einmaligen Unternehmenskultur, verbunden mit einer attraktiven Vergütung
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Eine umfangreiche Einarbeitung durch ein starkes, innovatives Team
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Ein kooperatives Arbeitsklima mit Freiraum zur Verwirklichung eigener Ideen
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Flexible Arbeitszeiten und die Möglichkeit, Aufgaben auch mobil zu erledigen
Wenn Sie ein Teamplayer sind, der gern selbständig und verantwortungsvoll arbeitet, dann sind Sie bei uns richtig. Auch Berufseinsteiger/-innen sind bei uns herzlich willkommen. Wir bieten Ihnen eine unbefristete Anstellung mit einer langfristigen Perspektive. Freuen Sie sich auf eine angenehme Arbeitsatmosphäre mit kurzen Entscheidungswegen!
Fühlen Sie sich angesprochen? Dann freuen wir uns auf Ihre vollständige Bewerbung mit Gehaltsvorstellung und möglichem Eintrittstermin, vorzugsweise per E-Mail.
Die IONTOF GmbH ist ein mittelständisches Unternehmen und stellt an ihrem Hauptsitz im Wissenschaftspark Münster innovative High-Tech-Geräte zur Oberflächenanalytik für namhafte Kunden in Industrie und Forschung her. Um unsere Führungsposition in diesem Zukunftsmarkt weiter auszubauen, setzen wir auch auf eine kompetente und erfolgreiche Kundenbetreuung. Daher suchen wir zum nächstmöglichen Zeitpunkt zur Verstärkung unseres engagierten Teams in Vollzeit eine(n) Elektroniker (m/w/d).
Ihre Aufgaben
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Eigenverantwortliche Montage, Überprüfung und Reparatur elektronischer Platinen und Baugruppen
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Muster- und Prototypenbau in der Entwicklung
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Dokumentation von Reparaturen, Erstellen und Überprüfen technischer Stücklisten
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Anleitung und Unterstützung der Produktion
Ihr Qualifikation
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Abgeschlossene Berufsausbildung im Bereich Elektronik / Mechatronik
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Erfahrung in der Montage / im Löten elektronischer Baugruppen
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Kenntnisse elektronischer Bauelemente und üblicher Messgeräte
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Gewissenhafte, präzise, selbständige Arbeitsweise
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Gute Auffassungsgabe, Teamfähigkeit und Lernbereitschaft
Unser Angebot
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Förderung und Unterstützung bei der beruflichen wie persönlichen Weiterentwicklung
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Eine Karriere in einem zukunftssicheren Unternehmen mit einer einmaligen Unternehmenskultur, verbunden mit einer attraktiven Vergütung
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Eine umfangreiche Einarbeitung durch ein starkes, innovatives Team
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Ein kooperatives Arbeitsklima mit Freiraum zur Verwirklichung eigener Ideen
Wenn Sie ein Teamplayer sind, der gern selbständig und verantwortungsvoll arbeitet, dann sind Sie bei uns richtig. Wir bieten Ihnen eine unbefristete Anstellung mit einer langfristigen Perspektive und flexiblen Arbeitszeiten. Freuen Sie sich auf eine angenehme Arbeitsatmosphäre mit kurzen Entscheidungswegen!
Fühlen Sie sich angesprochen? Dann freuen wir uns auf Ihre vollständige Bewerbung mit Gehaltsvorstellung und möglichem Eintrittstermin, vorzugsweise per E-Mail.
Masterarbeit "Erstellung einer LEIS Referenzdaten-Sammlung"
IONTOF ist ein Hersteller von innovativen Geräten für die Oberflächenanalyse mit verschiedenen Produktlinien für Flugzeit-Sekundärionenmassenspektrometrie (Time-of-Flight Secondary Ion Mass Spectrometry, ToF-SIMS) und niederenergetische Ionenstreuung (Low Energy Ion Scattering, LEIS).
Gegründet als klassisches spin-off der Universität Münster ist IONTOF heute der technologische Vorreiter im Bereiche der ToF-SIMS und LEIS Geräte. Um unsere führende Position zu stärken, möchten wir Studierenden die Möglichkeit geben, Einblick in diese Felder zu erlangen und eine Masterarbeit anzufertigen.
Beschreibung der Tätigkeit
Verbesserung der Quantifizierung von LEIS Spektren und Aufbau einer Sammlung von Referenzdaten:
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Beherrschen der Grundlagen und Anwendung von LEIS sowie Bedienung des Gerätes, inkl. Software für die Gerätesteuerung und Datenauswertung
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Entwicklung und Umsetzung eines Messplans, inkl. Probenauswahl, Präparation, in-situ Vorbehandlung zur Beseitigung von atmosphärischen Kontaminationen und Analyse unter verschiedenen Messbedingungen
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Datenanalyse, Visualisierung und strukturierte Datenablage der Messergebnisse
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Validierung der Ergebnisse durch Verwendung mehrerer Proben und ggfls. verschiedener LEIS Geräte
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Idealerweise Anfertigung eines Manuskripts für eine datenorientierte wissenschaftliche Zeitung (peer-reviewed)
Erwartete Qualifikation
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Fortgeschrittenes Studium der Materialwissenschaften, Analytischen Chemie, Oberflächenwissenschaften oder Scientific Instrumentation
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Fähigkeit schnell zu lernen und strukturiert,mit Aufmerksamkeit für die Details zu arbeiten, sowohl im Labor als auch bei der Dokumentation
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Interesse an der beschriebenen Aufgabe und der Verbesserung eines innovativen oberflächenanalytischen Verfahrens
Unser Angebot
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Intensives Training aller Aspekte von LEIS (idealerweise als Praktikum/Projektarbeit vor Beginn der Masterarbeit)
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Einblicke in ein global agierendes Unternehmen in einem wissenschaftlichen/ hochtechnologischen Umfeld
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Verantwortung für das Projekt und Raum für eigene Ideen
Research and Advanced Engineering Surface Scientist
Job Schedule
Full time
Job Category
Research and Advance Engineering
Degree Level
Doctorate Degree or equivalent
Locations
Dearborn, Michigan, 48124, USA
Remote
No
Job Identification
32045
Visa sponsorship is available for this position.
Job Description
At Ford Motor Company, we believe freedom of movement drives human progress. We also believe in providing you with the freedom to define and realize your dreams. With our incredible plans for the future of mobility, we have a wide variety of opportunities for you to accelerate your career potential as you help us define tomorrow’s transportation.
Ford’s Research and Advanced Engineering team explores new vehicle and societal innovations that require some level of invention before they can be applied to our products and services. The team is building on a history of Ford innovation, including our invention of the three-way catalytic converter to modernize vehicle emissions controls in the 1970s and the world’s first rear inflatable seat belts in 2010.
The Materials, Processing, Structures and Safety Laboratory in Ford’s Research and Advanced Engineering organization is seeking an employee to work in the Coatings and Surfaces Research Department. The department’s focus is on fundamentally understanding coatings and surfaces that are applied in the manufacturing of automobiles. The research in this group is multidisciplinary and includes topics such as: surface characterization of various materials, battery cell manufacturing, corrosion, color science, and adhesion. Additionally, we also incorporate computer simulations to model manufacturing processes of materials and surfaces. This exciting research role requires, a multi-functional relationship with several organizations within Ford, which include Ford EV, Digital, and Design, Ford Industrial System, Ford Ion Park, and Manufacturing.
Responsibilities
What you will do ...
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Perform fundamental and applied research in the area of surface chemistry with an emphasis on the use of time-of-flight secondary ion mass spectrometry (ToF-SIMS).
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Develop a robust, multidisciplinary research portfolio focused on the behavior of surfaces of materials used in the automotive industry. A particular emphasis in this position will be the characterization of Li-ion battery materials and the effect of various processes on the chemical and physical properties of electrode materials.
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Develop advanced characterization techniques using a suite of analytical tools including ToF-SIMS, XPS, AES, AFM, and other emerging instrumentation.
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Rapidly solve time-critical Company issues using novel experimental approaches.
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Grow a network of collaboration inside of Ford and outside of Ford with universities, government laboratories and suppliers.
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Document research via internal reports and external publications and presentations.
Qualifications
What you will have ...
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Ph.D. in Chemistry, Materials Science & Engineering, Chemical Engineering or Physics or a related field or international Equivalent
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3+ years of hands-on experience with ultra-high vacuum surface analytical instruments e.g.. ToF-SIMS, XPS, AFM and/or AES.
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3+ years of experience with the analysis of large data sets.
Even better, you may have ...
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Extensive hands-on experience with ToF-SIMS instrumentation and analysis
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Extensive knowledge of Li-ion battery chemistry
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Experience with surface and bulk material characterization: SEM,, FTIR, XRD, XRF, GDOES, Raman spectroscopy, and UV spectroscopy.
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Outstanding digital literacy as well as written and oral communication skills.
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Great teammate with strong interpersonal skills.
You may not check every box, or your experience may look a little different from what we've outlined, but if you think you can bring value to Ford Motor Company, we encourage you to apply!
As an established global company, we offer the benefit of choice. You can choose what your Ford future will look like: will your story span the globe, or keep you close to home? Will your career be a deep dive into what you love, or a series of new teams and new skills? Will you be a leader, a changemaker, a technical expert, a culture builder…or all of the above? No matter what you choose, we offer a work life that works for you, including:
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Immediate medical, dental, vision and prescription drug coverage
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Flexible family care days, paid parental leave, new parent ramp-up programs, subsidized back-up child care and more
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Family building benefits including adoption and surrogacy expense reimbursement, fertility treatments, and more
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Vehicle discount program for employees and family members and management leases
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Tuition assistance
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Established and active employee resource groups
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Paid time off for individual and team community service
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A generous schedule of paid holidays, including the week between Christmas and New Year’s Day
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Paid time off and the option to purchase additional vacation time.
Candidates for positions with Ford Motor Company must be legally authorized to work in the United States. Verification of employment eligibility will be required at the time of hire.
We are an Equal Opportunity Employer committed to a culturally diverse workforce. All qualified applicants will receive consideration for employment without regard to race, religion, color, age, sex, national origin, sexual orientation, gender identity, disability status or protected veteran status. In the United States, if you need a reasonable accommodation for the online application process due to a disability, please call 1-888-336-0660.
For more information and the full job description follow this link.
As Metrology Engineer, you will perform daily ToF-SIMS analyses and will develop new approaches to address metrology challenges.
What you will do
The composition analysis team provides imec-wide support in materials characterization by means of secondary ion mass spectrometry (SIMS) using both Time-of-Flight (ToF-SIMS) and Magnetic Sector (MS-SIMS) instruments. As ToF-SIMS Metrology engineer, you will perform daily ToF-SIMS measurements to support the fab demand, the different R&D activities within imec and the PhD student works. You will also be working closely with the researchers of the SIMS team in developing for example new internal SIMS references, optimizing ToF-SIMS analysis conditions for specific requests, optimizing the ToF-SIMS instrument, ....
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You perform daily ToF-SIMS analyses.
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You contribute and oversee the execution, interpretation, and reporting of ToF-SIMS analyses, and you advise internal and external customers.
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You investigate and develop new methods / approaches to address metrology challenges (e.g. low-dimensional nanostructures).
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You document best practices and provide training to the team members.
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You contribute to deliverables of funded research projects and programs.
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You contribute to internal conferences/workshops.
The work will consist of experimental work, data analysis and interpretation, interaction with imec engineers/researchers, and of literature studies. As part of the Materials and Component Analysis (MCA) department, it is expected that you gain knowledge in other characterization methods in the MCA department and in the fab, and that you correlate your results to other characterization methods and to the advanced process and device technology.
What we do for you
We offer you the opportunity to join one of the world’s premier research centers in nanotechnology at its headquarters in Leuven, Belgium. With your talent, passion and expertise, you’ll become part of a team that makes the impossible possible. Together, we shape the technology that will define the society of tomorrow.
We are?committed to being an inclusive employer?(http://www.imec-int.com/en/careers#diversity) and proud of our open, multicultural, and informal working environment with ample possibilities to take initiative and show responsibility. In everything we do, your future colleagues are guided by the imec values of passion, excellence, connectedness, and integrity. We commit to supporting and guiding you in this process, not only with words but also with tangible actions. Through imec.academy, 'our corporate university', we actively invest in your development to further your technical and personal growth.
We are aware that your valuable contribution makes imec a top player in its field. Your energy and commitment are therefore appreciated by means of a market appropriate salary with many fringe benefits.
Who you are
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You have a Master of Science / Master in Engineering or a PhD in Physics or Chemistry.
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You have experience in ToF-SIMS (and Scanning Probe Microscopy) in an academic or industrial R&D lab environment.
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You have strong analytical skills and intellectually creativity.
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You show excellent communication and reporting skills as you will be required to interface with internal customers.
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Experienced in materials characterization, both experimental and theoretical, is highly valued.
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Since you will be working in a highly international environment and will be maintaining a good contact with colleagues and co-workers from all over the world, fluency in English is essential.
For more information and the full job description follow this link.
Setup, operation and maintenance of imaging mass spectrometers
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Sample preparation for mass spectrometry imaging, eg cryo-sectioning
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Analytical method development & MSI data analysis of MALDI and SIMS imaging data
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Independent project management: from kick-off meeting, identification of the scientists' needs, performing analysis, data treatment and data presentation to the customers/scientists in close collaboration with the head of the unit
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Reporting results and assisting scientists in preparing data for publication
Required education and skills
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PhD degree in Analytical Chemistry/Chemistry or Physics in an academic institute or university
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Experience in a mass spectrometry or mass spectrometry imaging an advantage
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LC/MS & metabolomics of biological samples experience an advantage
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Consistent record of analytical and problem-solving skills as required in an academic research institute
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Strong communication skills in English, verbally and in writing and the ability to efficiently coordinate projects with customers/principle investigators in the institute
Division
Department of Life Sciences Research
Job field
lab worker
Job number
63423
For more information and the full job description follow this link.
ToF-SIMS and OrbitrapTM-SIMS analyses to unravel the chemistry of thin EUV photoresist layers
Leuven
Help define the future of lithography.
Photolithography is a well-established process used for patterning in microelectronic device fabrication. In Extreme Ultra-Violet (EUV) lithography – the most recent lithography technology using photons of 13.5 nm wavelength - research is ongoing regarding the fundamental resist (PR) chemistry active in the different components of chemically amplified resists (CARs), metal oxide resists (MORs), scissioning type resists, molecular resists. In the case of the well-known CAR system, multiple components are involved in its formulation (i.e. polymer, Photo Acid Generator (PAG) and quencher) at various steps of the process. Indeed, many aspects are still not fully understood, with examples including, but not limited to, the distribution of each constituent within the photoresist layer, the specific products generated by the chemical reactions involved, and the proportion of components able to efficiently carry out the reactions (i.e. acid formation, deprotection, etc.). Further research is addressed to the understanding of the underlayer underneath the resist and their relationship/interdependency.
Secondary Ion Mass Spectrometry (SIMS) is a key surface analysis technique in which 1D (depth profiles), 2D (spatial imaging) and 3D (volumetric imaging) distributions of elements and molecules with a solid substrate can be derived. SIMS operates by directing an energetic ion beam, termed the primary ion beam, at the surface of interest. This induces the emission of surface atoms and molecules, with a small fraction departing in an ionized state. The departing ions, henceforth referred to as secondary ions, are extracted and passed through a mass analyzer such that all elements (H-U), isotopes thereof, as well as molecules can be identified.
When examining organic films, molecular integrity can be retained through the use of a Gas Cluster Ion Beam (GCIB) as this allows for the impact energy per atom (within the impacting molecule) to be reduced to inter-molecular bond energies. And since inter-molecular bond energies are less than intra-molecular bond energies, GCIBs provide a means to non-destructively examine organic molecules and their distributions in 1D, 2D and 3D.
Time of Flight (ToF)-SIMS is one of the most heavily used techniques to study the distribution of organics. This is due to its capability of detecting characteristic molecular peaks of the studied system with a high mass resolving power of ~104, with a lateral resolution of <100 nm, with a depth resolution of <5 nm and all to high sensitivity. However, when studying organic systems such the photoresist layers described, much higher mass resolving power might be needed to avoid any mass interference that would result in incorrect data interpretation. OrbitrapTM mass analyzers are a recent addition to the SIMS arsenal that allows for even greater mass resolving power (~20× that possible in ToF-SIMS) and the possibility for carrying out Tandem Mass Spectrometry (MS) (also called MS/MS) secondary ion peak verification. The MS/MS capability has been highly successful in the analysis of complex organic materials in mass spectrometry. This allows for greater confidence in peak assignments, especially when examining large organic molecular secondary ions.
The OrbitrapTM-SIMS analytical methodology has been already successfully applied to a variety of biological systems, especially thanks to the label-free imaging approach and the MS/MS capability, as first reported by Passarelli et al.. A first demonstration of the need for such an approach in the analysis of photoresist layers has been recently provided by Spampinato et al..
This project aims to the further application of ToF-SIMS and OrbitrapTM-SIMS methodologies (including the use of GCIB and MS/MS capabilities) to unlocking the chemistry involved during the EUV photo exposure on thin photoresist layers when the composition and the processing conditions vary. This study will also give the opportunity to find a clear logic between formulation and performances of such layers.
This work will be done in a collaboration between imec, Belgium (PR group and Materials and Components Analysis department) and National Physical Laboratory (NPL), UK, offering expertise in a multitude of characterization techniques in support of this project. The very close collaboration with the process engineers of imec and its partners warrants direct industrial impact.
For more information and the full job description follow this link.
Link: Job description imec
IONTOF is neither responsible nor liable for any details or contents of the third party opportunites.
All corresponding communication has to be made directly with the respective employing institution.
